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The Bruker Innova Atomic Force Microscope (AFM) is a versatile and user-friendly system designed for high-resolution imaging of surfaces at the nanoscale. It features a stable, low-noise scanner with closed-loop control for accurate measurements in both air environments. Its top-down optical view makes it easy to align the cantilever, while the open stage design allows convenient access to samples and accessories. The Innova supports multiple imaging modes, including contact, tapping, and force spectroscopy, making it suitable for materials science, nanotechnology, and biological research.

The Bruker Innova AFM is used for high-resolution surface characterization, allowing researchers to measure nanoscale topography, roughness, force spectroscopy, and surface features.

The Bruker Innova AFM can analyze a wide range of samples, including:

• Solid surfaces (metals, ceramics, semiconductors)
• Thin films and coatings
• Polymers and nanocomposites
• Nanomaterials (nanoparticles, nanotubes, nanowires)
• Soft materials (hydrogels, biomaterials)
• Electronics materials (MEMS, sensors, conductive surfaces)

Most samples need to be flat, clean, and stable for accurate AFM scanning.