Laboratory Equipment & Services Information System by Centralized Laboratory Management Office (CeLMO)

(A) SPECIAL FEATURES 

1. Multi technique surface analysis including XPS, SAM, ISS, and UPS
2. Qualitative and quantitative analysis and composition
3. Chemical state analysis and quantification
4. Minimum spot size analysis of 15 um.
5. Real time parallel quantitative chemical imaging at resolution of 3 micron.
6. Angle resolved spectroscopy for film thickness measurement.

(B) APPLICATIONS

1. Adhesion, Bonding and Coating
2. Chemical and Elemental Maps
3. Contamination
4. Failure Analysis
5. Material Nanomaterials Characterization
6. Microscopy and Analytical Imaging

(C)SAMPLE REQUIREMENTS 

1. Powder or solid sample
2. Sample must be dry for vacuum purpose.

Multi techniques capability to determine 

• Chemical composition
• Chemical state/ reaction
• Electronic state
• Interface/ interface reactions
• Quantitative analysis
• Thickness measurement and depth profiling