Laboratory Equipment & Services Information System by Centralized Laboratory Management Office (CeLMO)

> High vacuum mode (chamber vacuum pressure < 6 e-4 Pa; nominal 1.0 nm electron beam resolution at 30 kV) used for high-resolution imaging and microanalyses of conductive samples in both secondary electron (SE) and backscattered (BSE) modes. > Low vacuum mode (chamber vacuum pressure 10 – 130 Pa; nominal 1.4 nm electron beam resolution at 30 kV) for high-resolution imaging and microanalyses of non-conductive samples in both secondary electron and backscatter modes. > Extended low vacuum mode ESEM (chamber vacuum pressure 10 – 4000 Pa; nominal 1.4 nm electron beam resolution at 30 kV) for charge-free imaging and microanalysis of non-conductive and/or hydrated specimens.

The FEI Quanta 450 FEG is a field emission gun – scanning electron microscope (FEG-SEM) used for high-resolution imaging (morphological and compositional) of both conductive and non-conductive specimens at the nanometer-scale resolution (magnification range: from 6 x to 1,000,000 x) and for semi-quantitative X-ray microanalysis. The instrument operates under three imaging modes: high and low vacuum and extended low vacuum modes. The instrument can thus accommodate multiple sample, imaging and analytical requirements for both material and life sciences, allowing investigation of a wide range of traditional and non-traditional samples with or without preparation, including wet samples in their natural state